Image Based Metrology for Nanoscale Self-assembly Processes

Image Based Metrology for Nanoscale Self-assembly Processes

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Robust registration of 2d and 3d point sets. Image and Vision ... Unsupervised texture segmentation using gabor filters. Pattern Recognition ... [10] P. D. Kovesi. Matlab and octave functions for computer vision and image processing, 2000.


Title:Image Based Metrology for Nanoscale Self-assembly Processes
Author: Prabu Ravindran
Publisher: - 2007
ISBN-13:

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